Developing a model for the bond heel lifetime prediction of thick aluminium wire bonds
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[1] Herbert Reichl,et al. Investigation of microstructural processes during ultrasonic wedge/wedge bonding of AlSi1 wires , 2006 .
[2] Gerhard Wachutka,et al. Reliability model for Al wire bonds subjected to heel crack failures , 2000 .
[3] Yasushi Yamada,et al. Reliability of wire-bonding and solder joint for high temperature operation of power semiconductor device , 2007, Microelectron. Reliab..
[4] F. Berto,et al. Some Expressions for the Strain Energy in a Finite Volume Surrounding the Root of Blunt V-notches , 2005 .
[5] Cetin Morris Sonsino,et al. Fatigue design of highly loaded short-glass-fibre reinforced polyamide parts in engine compartments , 2008 .
[6] F. Theunis,et al. The effect of cyclic hardening in copper heat-sinks on die fracture probability , 2005, EuroSimE 2005. Proceedings of the 6th International Conference on Thermal, Mechanial and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005..
[7] R. Darveaux. Effect of simulation methodology on solder joint crack growth correlation , 2000, 2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070).
[8] Guy Lefranc,et al. Aluminum bond-wire properties after 1 billion mechanical cycles , 2003, Microelectron. Reliab..