Quantifying the Spin-Wave Asymmetry in Single and Double Rectangular Ni80Fe20 Microstrips by TR-STXM, FMR, and Micromagnetic Simulations

The asymmetry of spin-wave (SW) patterns in confined rectangular Ni80Fe20 microstrips, both in single- and double-strip geometries, is quantified. The results of time-resolved scanning transmission X-ray microscopy (TR-STXM) and micromagnetic simulations are compared. For the TR-STXM measurements and the corresponding simulations, the excitation was a uniform microwave (MW) field with a fixed frequency of 9.43 GHz, while the external static magnetic field was swept. In the easy axis orientation of the analyzed microstrip, the results show a higher asymmetry for the double microstrip design, indicating an influence of the additional microstrip placed in close proximity to the analyzed one.

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