A new apparatus for surface x‐ray absorption and diffraction studies using synchrotron radiation

A new apparatus for structural studies of surfaces and buried interfaces using synchrotron radiation was built and tested at the 27‐pole wiggler station BL13B of the Photon Factory. The apparatus was designed to combine x‐ray absorption fine structure (XAFS), x‐ray standing wave (XSW), and surface x‐ray diffraction techniques in the same ultrahigh vacuum (UHV) chamber. The apparatus features a seven‐element Si(Li) solid‐state detector array for a fluorescence yield measurement and a high precision eight‐axis goniometer in the UHV chamber with a base pressure of 1×10−10 Torr. For the same sample mounted on the in‐vacuum goniometer, vertically or horizontally polarized surface‐sensitive XAFS, surface x‐ray diffraction, and XSW can be measured. As a performance test, the structure of Ge overlayers on Si(001) was studied by polarized surface‐sensitive XAFS. The results show that the apparatus can probe the local structure of adatoms with ∼0.1 monolayer sensitivity.

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