论文信息 - Low-leakage electrostatic discharge protection circuit in 65-nm fully-silicided CMOS technology

Low-leakage electrostatic discharge protection circuit in 65-nm fully-silicided CMOS technology

A new low-leakage power-rail electrostatic discharge (ESD) clamp circuit, composed of the SCR device and new ESD detection circuit, has been designed with consideration of gate current to reduce the total standby leakage current under normal circuit operating conditions. After fabrication in a 1-V 65-nm fully-silicided CMOS process, the proposed power-rail ESD clamp circuit can sustain 7kV human-body-model (HBM) and 325V machine model (MM) ESD tests which occupying an silicon area of only 49µm×21µm and consuming a very low standby leakage current of 96nA at room temperature.

Ming-Dou Ker | Tien-Hao Tang | Kuan-Cheng Su | Chang-Tzu Wang

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