Reducing hysteresis effect of force actuator in a Scanning Probe Microscope
暂无分享,去创建一个
[1] Greg Haugstad,et al. Mechanisms of dynamic force microscopy on polyvinyl alcohol: region-specific non-contact and intermittent contact regimes , 1999 .
[2] Stuart T. Smith,et al. Signal fidelity and tracking force in stylus profilometry , 1992 .
[3] Teodor Gotszalk,et al. Fabrication of multipurpose piezoresistive Wheatstone bridge cantilevers with conductive microtips for electrostatic and scanning capacitance microscopy , 1998 .
[4] Teodor Gotszalk,et al. Microfabricated cantilever with metallic tip for electrostatic and capacitance microscopy and its application to investigation of semiconductor devices , 2004 .
[5] Stuart T. Smith,et al. A controlled-force stylus displacement probe , 1996 .
[6] Kazuo Nishimura. Empirical evaluation of object-oriented programming effectiveness in different types of program , 2009, 2009 ICCAS-SICE.
[7] Derek G. Chetwynd,et al. Improvement of the fidelity of surface measurement by active damping control , 1993 .
[8] Jium-Ming Lin,et al. Profiler design with multi-sensor data fusion methods , 2007, SICE Annual Conference 2007.
[9] J. Bennett,et al. Stylus profiling instrument for measuring statistical properties of smooth optical surfaces. , 1981, Applied optics.
[10] V. V. Prokhorov,et al. Probe-surface interaction mapping in amplitude modulation atomic force microscopy by integrating amplitude-distance and amplitude-frequency curves , 2007 .
[11] Sidney R. Cohen,et al. Force microscopy with a bidirectional capacitance sensor , 1990 .
[12] Jium-Ming Lin,et al. Scanning probe microscope system design with Linear Velocity Transducer for feedback compensation , 2008, 2008 SICE Annual Conference.