论文信息 - Roughness of the SiC/SiO2 vicinal interface and atomic structure of the transition layers - 字舞流文

Roughness of the SiC/SiO2 vicinal interface and atomic structure of the transition layers

S. Dhar | G. Duscher | Y. Sharma | John R. Williams | T. Isaacs-Smith | A. Ahyi | Guoliang Li | Peizhi Liu | T. Isaacs-smith