Direct measurement of the thickness-dependent electronic band structure of MoS2 using angle-resolved photoemission spectroscopy.
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A. M. van der Zande | J. Dadap | R. Osgood | J. Hone | P. Sutter | I. Herman | J. Sadowski | P. Yeh | D. Chenet | Wencan Jin | N. Zaki | Datong Zhang | A. Al-Mahboob | Daniel A. Chenet | A. Al‐Mahboob
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