Thick Dielectric Charging on High-Altitude Spacecraft,

Abstract Thick dielectric charging, in which energetic electrons embed within bulk dielectrics, building up to potentials in excess of the breakdown potential of the dielectric, is shown to be a causative factor in anomalous operation of high-altitude satellites. A table of maximum expected electron fluxes in various altitude orbits is presented. Consideration of these maximum fluxes and the fact that the energy associated with a bulk dielectric breakdown is small demonstrates that bulk charging can be eliminated as a spacecrafts problem through minimal shielding (400 mg/cm 2 ) of all cables and circuit boards otherwise exposed to the environment, and through desensitizing digital logic inputs which are serviced by cables.