Development and application of a statistically based feature extraction algorithm for monitoring tool wear in Circuit Board Assembly
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Melvin J. Hinich | R. W. Barker | R. J. Thornhill | C. N. Ramirez | G. A. Klutke | M. Hinich | G. Klutke | R. Thornhill | R. W. Barker | M. J. Hinich | C. Ramirez
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