Strength of shock-loaded single-crystal tantalum [100] determined using in situ broadband x-ray Laue diffraction.
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P. Rosen | J. Satcher | B. Remington | J. Wark | R. Rudd | J. Hawreliak | B. Maddox | J. Foster | H. Park | A. Higginbotham | S. Prisbrey | P. Graham | A. Comley | D. Orlikowski | S. C. Peterson | A. Elsholz | N. Bazin | N. Park | S. Rothman | M. Suggit
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