The use of EM-CCDs on high resolution soft x-ray spectrometers
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Andrew D. Holland | Randall L. McEntaffer | Neil J. Murray | James H. Tutt | James Endicott | David J. Hall | Richard D. Harriss | Matt Soman | A. Holland | M. Soman | D. Hall | N. Murray | J. Endicott | J. Tutt | R. Harriss | R. McEntaffer
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