论文信息 - The Effect of Elevated Temperature on Latchup and Bit Errors in CMOS Devices

The Effect of Elevated Temperature on Latchup and Bit Errors in CMOS Devices

Equipment for testing microcircuits at elevated temperatures for Single Event Phenomena (SEP) such as upset (SEU) and latchup (SEL) has been developed and measurements on several device types have been performed. Very large changes in cross-section and threshold LET have been observed over the temperature range of 25°C to 120°C for SEU and SEL.

R. Koga | W. A. Kolasinski | E. Schnauss | J. Duffey

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