Force sensing and mapping by atomic force microscopy

Over the past 15 years, advances in the field of atomic force microscopy (AFM) have broadened its use from a high-resolution imaging instrument to a device capable of detecting and quantifying single molecular forces between surfaces in near-native conditions. This article reviews developments in the force sensing field and focuses particularly on research that has seen the AFM utilised to produce two-dimensional maps of specific molecular interaction sites on a sample surface.

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