Validation of a statistical non-linear model of GaAs HEMT MMIC's by hypothesis testing and principal components analysis

A distance-dependent non-linear statistical model of the active part of a very short-length HEMT-based MMIC, expressed in terms of principal components, is presented. A statistical model has been extracted for 0.1 mum GaAs HEMT devices and MMIC's. Validation of the model is presented, based on principal component analysis and statistical hypothesis testing