论文信息 - Characterization of silicon ion-implantation damage in single-strained-layer (InGa)As/GaAs quantum wells - 字舞流文

Characterization of silicon ion-implantation damage in single-strained-layer (InGa)As/GaAs quantum wells

C. R. Hills | I. J. Fritz | G. W. Arnold | R. M. Biefeld | B. Doyle | D. R. Myers | L. Dawson