LCD 표면 검사를 위한 적응적 결함패턴 분류 알고리즘

In this paper, we propose an adaptive defect pattern algorithm for LCD surface inspection. The defect inspection algorithm of the LCD consists of preprocessing, feature extraction and defect classification. Preprocess removes noise from LCD image, using morphology operator and neural network is used for the defect classification. Sample images with scratch, pinholes, and spot from real LCD color filter image are used. The proposed algorithms show that defect detected and classified in the ratio of 92.3% and 94.6 respectively.