A self-testing ALU using built-in current sensing
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[1] Randal E. Bryant,et al. COSMOS: a compiled simulator for MOS circuits , 1987, DAC '87.
[2] Wojciech Maly,et al. Test generation for current testing , 1989, [1989] Proceedings of the 1st European Test Conference.
[3] Wojciech Maly,et al. Testing oriented analysis of CMOS ICs with opens , 1988, [1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers.
[4] J. M. Soden,et al. Electrical properties and detection methods for CMOS IC defects , 1989, [1989] Proceedings of the 1st European Test Conference.
[5] Mark W. Levi,et al. CMOS Is Most Testable , 1981, International Test Conference.
[6] Wojciech Maly,et al. Current sensing for built-in testing of CMOS circuits , 1988, Proceedings 1988 IEEE International Conference on Computer Design: VLSI.
[7] Charles F. Hawkins,et al. Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs , 1985, ITC.
[8] John J. Zasio,et al. Non Stuck Fault Testing of CMOS VLSI , 1985, COMPCON.
[9] Yashwant K. Malaiya,et al. A New Fault Model and Testing Technique for CMOS Devices , 1982, International Test Conference.
[10] Wojciech Maly,et al. Built-in current testing-feasibility study , 1988, [1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers.