BDD FTEST: fast, backtrack-free test generator based on binary decision diagram representation
暂无分享,去创建一个
[1] Dong Sam Ha,et al. AN EFFICIENT, FORWARD FAULT SIMULATION ALGORITHM BASED ON THE PARALLEL PATTERN SINGLE FAULT PROPAGAT , 1991, 1991, Proceedings. International Test Conference.
[2] Vishwani D. Agrawal,et al. A transitive closure algorithm for test generation , 1993, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[3] Michael H. Schulz,et al. Improved deterministic test pattern generation with applications to redundancy identification , 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[4] Randal E. Bryant,et al. Efficient implementation of a BDD package , 1991, DAC '90.
[5] Tracy Larrabee. Efficient generation of test patterns using Boolean difference , 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.
[6] David Bryan,et al. Combinational profiles of sequential benchmark circuits , 1989, IEEE International Symposium on Circuits and Systems,.
[7] Prabhakar Goel,et al. An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits , 1981, IEEE Transactions on Computers.
[8] F. F. Sellers,et al. Analyzing Errors with the Boolean Difference , 1968, IEEE Transactions on Computers.
[9] Ted Stanion,et al. TSUNAMI: a path oriented scheme for algebraic test generation , 1991, [1991] Digest of Papers. Fault-Tolerant Computing: The Twenty-First International Symposium.
[10] Janusz Rajski,et al. A method to calculate necessary assignments in algorithmic test pattern generation , 1990, Proceedings. International Test Conference 1990.
[11] Randal E. Bryant,et al. Graph-Based Algorithms for Boolean Function Manipulation , 1986, IEEE Transactions on Computers.
[12] CATAPULT: concurrent automatic testing allowing parallelization and using limited topology , 1988, 25th ACM/IEEE, Design Automation Conference.Proceedings 1988..
[13] Albert R. Wang,et al. Logic verification using binary decision diagrams in a logic synthesis environment , 1988, [1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers.
[14] Hideo Fujiwara,et al. On the Acceleration of Test Generation Algorithms , 1983, IEEE Transactions on Computers.