Modeling & Monitoring of Product DPPM with Multiple Fail Modes

A method to model and de-rate product DPPM using existing production EFR (early failure rate) and burn-in data is proposed. This approach incorporates multiple classes of reliability fail modes. Changes in process, test, or design may then be employed to optimize product outgoing defect levels. These changes will be based on the defect acceleration kinetic parameters, instead of just the reliability fail-fraction or wafer sort yield. Monitoring of low part-per-million defects is also critical in maintaining general quality and a new method is discussed

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