Realizing the benefits of structural test for Intel microprocessors

This paper traces the evolution of the distributed test strategy at Intel, covering both the tester platform, which is now on the 2nd generation, as well as the parallel evolution of the test content, which is optimized for this platform. We describe the distribution of Pentium/spl reg/ 4 processor test content between structural and functional platforms, associated fallout, and key issues encountered with content migration. Finally, we discuss future test content and platform trends as shaped by increasing device complexity and defect types.

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