Subsolidus phase equilibria in the RuO2 - Bi2O3 - SiO2 system

Subsolidus equilibria in the RuO2–Bi2O3–SiO2 diagram were studied with the aim of investigating possible interactions between the bismuth-ruthenate- based conductive phase and the silica-rich glasses in thick-film resistors. The tie lines are between Bi2Ru2O7 and Bi12SiO20 (gamma phase), between Bi2Ru2O7 and Bi4Si3O12, and between RuO2 and Bi4Si3O12. This indicates that the bismuth ruthenate is not stable in the presence of the silica-rich glass phase.

[1]  Bruno Morten,et al.  Lead-free ruthenium-based thick-film resistors: a study of model systems , 1991 .

[2]  E. M. Levin,et al.  Polymorphism of Bismuth Sesquioxide. II. Effect of Oxide Additions on the Polymorphism of Bi2O3 , 1964, Journal of research of the National Bureau of Standards. Section A, Physics and chemistry.

[3]  J. Hormadaly,et al.  Microstructure development and electrical properties of RuO2-based lead-free thick film resistors , 2006 .

[4]  Darko Belavic,et al.  Microstructural, XRD and electrical characterization of some thick film resistors , 2000 .

[5]  Darko Belavic,et al.  The influence of firing temperature on the electrical and microstructural characteristics of thick-film resistors for strain gauge applications , 2003 .

[7]  Darko Belavic,et al.  A characterization of thick-film PTC resistors , 2005 .

[8]  Darko Belavic,et al.  Subsolidus phase equilibria in the PbO-poor part of RuO2–PbO–SiO2 system , 2006 .

[9]  Yoshiaki Taketa,et al.  Control of Electrical Properties of RuO2 Thick Film Resistors , 1987 .

[10]  Esteban Broitman,et al.  Resistance adjustment in RuO2-based thick film strain-gauges by laser irradiation , 1997 .

[11]  Kenji Adachi,et al.  Effect of Glass Composition on the Electrical Properties of Thick‐Film Resistors , 2004 .

[12]  K. Adachi,et al.  Decomposition of Ruthenium Oxides in Lead Borosilicate Glass , 2005 .

[13]  G. E. Rachkovskaya,et al.  Properties, Structure, and Application of Low-Melting Lead–Bismuth Glasses , 2004 .

[14]  Osamu Abe,et al.  The Effect of Various Factors on the Resistance and TCR of RuO2 Thick Film Resistors—Relation Between the Electrical Properties and Particle Size of Constituents, the Physical Properties of Glass and Firing Temperature , 1988 .

[15]  Marko Hrovat,et al.  Phase equilibria in the 637-1637-1637-1system , 1988 .