ON THE IMAGING OF THIN DIELECTRIC INCLUSIONS VIA TOPOLOGICAL DERIVATIVE CONCEPT

In this paper, we consider the imaging of thin dielectric inclusions completed embedded in the homogeneous domain. To image such inclusion from boundary measurements, topological derivation concept is adopted. For that purpose, an asymptotic expansion of the boundary perturbations that are due to the presence of a small inclusion is considered. Applying this formula, we can design only one iteration procedure for imaging of thin inclusions by means of solving adjoint problem. Various numerical experiments without and with some noise show how the proposed techniques behave.

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