论文信息 - Efficient techniques for gate leakage estimation

Efficient techniques for gate leakage estimation

Gate leakage current is expected to be the dominant leakage component in future technology generations. In this paper, we propose methods for steady-state gate leakage estimation based on state characterization. An efficient technique for pattern-dependent gate leakage estimation is presented. Furthermore, we propose the use of this technique for estimating the average gate leakage of a circuit using pattern-independent probabilistic analysis. Results on a large set of benchmark ISCAS circuits show an accuracy within 5% of SPICE results with 500/spl times/ to 50000/spl times/ speed improvement.

A. Devgan | R.M. Rao | J.L. Burns | R.B. Brown

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