Grazing incident X-ray fluorescence combined with X-ray reflectometry metrology protocol of telluride-based films using in-lab and synchrotron instruments
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A. Roule | P. Gergaud | D. Eichert | Y. Ménesguen | E. Nolot | Y. Mazel | W. Pessoa | M. Lépy | M. Bernard | A. Novikova | F. Brigidi