论文信息 - Simultaneous switching noise coupling through via transition for a CMOS negative feedback Operational Amplifier in System-in-Package

Simultaneous switching noise coupling through via transition for a CMOS negative feedback Operational Amplifier in System-in-Package

In this paper, a modeling method [1] is proposed to investigate the simultaneous switching noise coupling path and effects on the Operational Amplifier (Op-Amp). This method combines an analytical model and interconnection models for the chip-package co-modeling and co-analysis. CMOS Op-Amp is fabricated by TSMC 0.25um to validate the modeling method. It was successfully demonstrated by simulation and measurement with SSN noise, which has the frequency from 10MHz to 3GHz. It shows the necessity for the chip-package co-modeling and co-simulation of the System-In-Package (SIP).

[1] Joungho Kim,et al. Modeling and measurement of simultaneous switching noise coupling through signal via transition , 2006, IEEE Transactions on Advanced Packaging.

[2] Franco Fiori,et al. Nonlinear effects of radio-frequency interference in operational amplifiers , 2002 .

[3] Jaemin Kim,et al. Modeling and Analysis of Simultaneous Switching Noise Coupling for a CMOS Negative-Feedback Operational Amplifier in System-in-Package , 2009, IEEE Transactions on Electromagnetic Compatibility.