论文信息 - Boundary scan and its application to analog-digital ASIC testing in a board/system environment

Boundary scan and its application to analog-digital ASIC testing in a board/system environment

The author introduces the concept and motivations for developing boundary scan (BS) and explains the input BS cell, the output BS cell, and the bidirectional BS cell. He then describes the application of boundary scan to the testing of analog-digital application-specific integrated circuits (ASICs) in a board/system environment. An example is given to illustrate the concept and the application

P. P. Fasang

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[2] L. Whetsel. A proposed standard test bus and boundary scan architecture , 1988, Proceedings 1988 IEEE International Conference on Computer Design: VLSI.