The Impact of Pad Test-Fixture for De-embedding on Radio-Frequency MOSFETs

1. Department of Electrical Engineering, National University of Kaohsiung, Taiwan. 2. Department of Computer Science Information Engineering, Shu-Te University, Taiwan. 3. Institute of Microelectronics, National Cheng Kung University, Taiwan. 4. Taiwan Semiconductor Manufacturing Company, Science-Based Industrial Park, Hsin-Chu, Taiwan No.700,Kaohsiung University Rd., Nan-Tzu Dist., 811, Kaohsiung, Taiwan Tel: 886-7-5919372, Fax: 886-7-5919374, E-mail: wkyeh@nuk.edu.tw