The Coverage Problem for Random Testing

Random testing is frequently an attractive alternative to deterministic test generation. How to estimate the coverage obtained by random testing is an important problem. This paper considers a possible technique for combinational circuits. Random testing properties of several combinational circuits are examined.

[1]  P. R. Schneider,et al.  On the necessity to examine D-chains in diagnostic test generation-an example , 1967 .

[2]  Alexander Miczo.  Fault Modelling for Functional Primitives , 1982, ITC.

[3]  Samiha Mourad.  An Optimized ATPG , 1980, 17th Design Automation Conference.

[4]  Eric Lindbloom,et al.  The Weighted Random Test-Pattern Generator , 1975, IEEE Transactions on Computers.

[5]  M. Ray Mercer,et al.  Testability Measures : What Do They Tell Us ? , 1982, ITC.

[6]  Jacob Savir,et al.  Good Controllability and Observability Do Not Guarantee Good Testability , 1983, IEEE Transactions on Computers.

[7]  C. C. Beh,et al.  Do Stuck Fault Models Reflect Manufacturing Defects? , 1982, ITC.

[8]  Jacob Savir,et al.  On Random Pattern Test Length , 1984, IEEE Transactions on Computers.

[9]  C. Timoc,et al.  Adaptive Self-Test for a Microprocessor , 1983, ITC.

[10]  VISHWANI D. AGRAWAL.  When to Use Random Testing , 1978, IEEE Transactions on Computers.

[11]  Gary S. Ditlow,et al.  Random Pattern Testability , 1984, IEEE Transactions on Computers.

[12]  René David,et al.  About Random Fault Detection of Combinational Networks , 1976, IEEE Transactions on Computers.

[13]  Jacques Losq,et al.  Efficiency of Random Compact Testing , 1978, IEEE Transactions on Computers.