A Parameterless Line Segment and Elliptical Arc Detector with Enhanced Ellipse Fitting

We propose a combined line segment and elliptical arc detector, which formally guarantees the control of the number of false positives and requires no parameter tuning. The accuracy of the detected elliptical features is improved by using a novel non-iterative ellipse fitting technique, which merges the algebraic distance with the gradient orientation. The performance of the detector is evaluated on computer-generated images and on natural images.

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