Application of a New Ray Tracing Framework to the Analysis of Extended Regions in Si Solar Cell Modules
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Matthias Winter | Karsten Bothe | Rolf Brendel | Pietro P. Altermatt | Malte R. Vogt | Marc Köntges | Hendrik Holst | K. Bothe | P. Altermatt | Hendrik Holst | R. Brendel | M. Vogt | M. Köntges | Matthias Winter | H. Holst
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