Grain boundary assisted degradation and breakdown study in cerium oxide gate dielectric using scanning tunneling microscopy
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Hiroshi Iwai | Nagarajan Raghavan | Kuniyuki Kakushima | Michel Bosman | Kin Leong Pey | Sunil Singh Kushvaha | K. Shubhakar | Sean J. O’Shea | M. Kouda | H. Iwai | K. Pey | K. Kakushima | N. Raghavan | M. Bosman | S. O’Shea | K. Shubhakar | S. S. Kushvaha | M. Kouda
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