Electrical transport and trap properties in nitrogen-doped p-type MBE-grown ZnSe layers on GaAs using different contact materials
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D. Zahn | D. Hommel | M. Behringer | M. Fehrer | E. Thomas | R. Beyer | H. Burghardt | G. Prösch
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D. Zahn | D. Hommel | M. Behringer | M. Fehrer | E. Thomas | R. Beyer | H. Burghardt | G. Prösch