Gate-bias stress in amorphous oxide semiconductors thin-film transistors
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Pedro Barquinha | Henrique L. Gomes | Elvira Fortunato | Rodrigo Martins | H. Gomes | E. Fortunato | P. Barquinha | R. Martins | I. Ferreira | L. Pereira | Isabel Ferreira | M. E. Lopes | M. C. Medeiros | Maria C. R. Medeiros | L. M. C. Pereira
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