Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics
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C. Haber | G. Moorhead | T. Dubbs | A. Grillo | S. Holland | A. Ciocio | M. Gilchriese | H. Iwasaki | T. Kohriki | T. Kondo | H. Sadrozinski | M. Shapiro | R. Takashima | S. Terada | Y. Unno | S. Kashigin | W. Kroeger | E. Spencer | M. Wilder | J. Dane | S. Pier | K. Fujita | T. Handa | Y. Iwata | T. Ohsugi | J. Emes | I. Kipnis | J. Siegrist | H. Spieler | M. Nakao | N. Tamura | J. Lozano-Bahilo | B. Rowe
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