论文信息 - Relationships between dielectric breakdown resistance and charge transport in alumina materials- : Effects of the microstructure - 字舞流文

Relationships between dielectric breakdown resistance and charge transport in alumina materials- : Effects of the microstructure

D. Juvé | D. Tréheux | H. Fitting | C. Guerret-Piecourt | M. Touzin | D. Goeuriot

[1] J. Liebault,et al. Microstructural origin of the dielectric breakdown strength in alumina: A study by positron lifetime spectroscopy , 2005 .

[2] H. Fitting,et al. Selfconsistent electrical charging in insulators , 2005 .

[3] D. Tréheux,et al. Secondary electron emission and self-consistent charge transport and storage in bulk insulators: Application to alumina , 2003 .

[4] D. Tréheux,et al. How the trapping of charges can explain the dielectric breakdown performance of alumina ceramics , 2001 .

[5] G. Blaise,et al. Space charge measurement in a dielectric material after irradiation with a 30 kV electron beam: Application to single-crystals oxide trapping properties , 1999 .

[6] G. P. Pells. Electrical conductivity of alumina in a radiation field at temperatures up to 700°C , 1986 .