论文信息 - Applying Complementary Trap Characterization Technique to Crystalline $\gamma$-Phase-$\hbox{Al}_{2} \hbox{O}_{3}$ for Improved Understanding of Nonvolatile Memory Operation and Reliability - 字舞流文

Applying Complementary Trap Characterization Technique to Crystalline $\gamma$-Phase-$\hbox{Al}_{2} \hbox{O}_{3}$ for Improved Understanding of Nonvolatile Memory Operation and Reliability

R. Degraeve | B. Govoreanu | M. Toledano-Luque | J. van Houdt | M. Zahid | D. R. Aguado | W. C. Wang | V. Afanasev