Optical methods for measurements of surface shape in optical components for high power laser beam forming

The paper presents modifications of full-field optical methods commonly used to test the surface quality of optical components used for forming a high power laser beam and tests of a final wavefront. The modifications in reference to surface measurements rely on implementation of the novel fringe pattern processing methods including the quality improvement of initial interferogram and analysis of a reconstructed phase based on Hilbert-Huang transform aided by the principal component analysis. Also the Point Diffraction Interferometer as the efficient tool for high quality measurements of elements with high NA is introduced. In reference to a wavefront quality measurements two solutions are discussed: the use of a lateral shear interferometer and the system employing Transport of Intensity Equation method. The pros and cons for both methods are discussed.

[1]  F. Roddier,et al.  Wavefront sensing and the irradiance transport equation. , 1990, Applied optics.

[2]  Maciej Trusiak,et al.  Single shot fringe pattern phase demodulation using Hilbert-Huang transform aided by the principal component analysis. , 2016, Optics express.

[3]  F Roddier,et al.  Wavefront reconstruction using iterative Fourier transforms. , 1991, Applied optics.

[4]  M. Allmen Laser-beam interactions with materials , 1987 .

[5]  Vladimir K. Kirillovsky,et al.  Principles of certification for high-precision optical parts and systems based on a diffraction interferometer , 2006 .

[6]  D. Malacara,et al.  Interferogram Analysis for Optical Testing , 2018 .

[7]  Xiangwan Du,et al.  Similarity of laser window thermal effects. , 2008, Applied optics.

[8]  J. Martinez-Carranza,et al.  Multi-filter transport of intensity equation solver with equalized noise sensitivity. , 2015, Optics express.

[9]  Chen Chen,et al.  Point diffraction interferometer with adjustable fringe contrast for testing spherical surfaces. , 2011, Applied optics.

[10]  N. Streibl Phase imaging by the transport equation of intensity , 1984 .

[11]  A. Barty,et al.  Quantitative phase‐amplitude microscopy. III. The effects of noise , 2004, Journal of microscopy.

[12]  Timur E. Gureyev,et al.  On x-ray phase imaging with a point source , 1998 .

[13]  Yongsheng Gao,et al.  A new lateral shearing interferometer for precision surface measurement , 2009 .

[14]  Kazuya Ota,et al.  Development of the point diffraction interferometer for extreme ultraviolet lithography: Design, fabrication, and evaluation , 2002 .