On-chip debug (OCD) features are frequently available in modern microprocessors. Their contribution to shorten the time-to-market justifies the industry investment in this area, where a number of competing or complementary proposals are available or under development, e.g. NEXUS, CJTAG, IJTAG. The controllability and observability features provided by OCD infrastructures provide a valuable toolbox that can be used well beyond the debugging arena, improving the return on investment rate by diluting its cost across a wider spectrum of application areas. This paper discusses the use of OCD features for validating fault tolerant architectures, and in particular the efficiency of various fault injection methods provided by enhanced OCD infrastructures. The reference data for our comparative study was captured on a workbench comprising the 32-bit Freescale MPC-565 microprocessor, an iSYSTEM IC3000 debugger (iTracePro version) and the Winidea 2005 debugging package. All enhanced OCD infrastructures were implemented in VHDL and the results were obtained by simulation within the same fault injection environment. The focus of this paper is on the comparative analysis of the experimental results obtained for various OCD configurations and debugging scenarios.
[1]
Juan José Serrano,et al.
INERTE: integrated nexus-based real-time fault injection tool for embedded systems
,
2003,
2003 International Conference on Dependable Systems and Networks, 2003. Proceedings..
[2]
Gustavo Ribeiro Alves,et al.
Real Time Fault Injection Using Enhanced OCD -- A Performance Analysis
,
2006,
2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.
[3]
Gustavo Ribeiro Alves,et al.
A Modified Debugging Infrastructure to Assist Real Time Fault Injection Campaigns
,
2006,
2006 IEEE Design and Diagnostics of Electronic Circuits and systems.
[4]
Gustavo Ribeiro Alves,et al.
Using NEXUS compliant debuggers for real time fault injection on microprocessors
,
2006,
SBCCI '06.