Extraction of functional regularity in datapath circuits

Datapath circuits exhibit a very high degree of regularity, which is exploited by designers to generate layouts with a high density and performance as well as to reduce the overall design effort. Regularity in a datapath circuit manifests itself at functional, structural, and topological levels. Functional regularity of a circuit implies the existence of logically equivalent subcircuits-a common feature of datapath circuits. We present a new and comprehensive approach to extract functional regularity for datapath circuits from their high-level or gate-level descriptions. The key step is the generation of a large set of templates, where a template is a subcircuit with multiple instances in the circuit. Two novel template generation algorithms are presented-one for templates with a tree structure, and the other for a special class of multioutput templates, called single-principal-output-graph (SPOG) templates, where all outputs of a template are in the transitive fanin of a particular output. The set of templates generated is shown to be complete under a few simplifying, yet practical, assumptions, which is key in obtaining a desirable cover of the circuit using templates. We present a few extensions to our regularity extraction approach to demonstrate its generality; these extensions include hierarchical representation of regularity and generation of instances of user-specified templates. We show that the generation of the above two classes of templates results in good covers for datapath circuits with a regular bus structure, including several International Conference on Computer-Aided Design benchmark circuits. The regularity extracted from these circuits can be used to easily understand their structure. We have successfully used our approach to identify bit slices of very large datapath circuits from general-purpose microprocessors.

[1]  Miodrag Potkonjak,et al.  Performance optimization using template mapping for datapath-intensive high-level synthesis , 1996, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[2]  Miodrag Potkonjak,et al.  Fast prototyping of datapath-intensive architectures , 1991, IEEE Design & Test of Computers.

[3]  Daniel W. Dobberpuhl Circuits and technology for Digital's StrongARM and ALPHA microprocessors [CMOS technology] , 1997, Proceedings Seventeenth Conference on Advanced Research in VLSI.

[4]  John P. Hayes,et al.  Unveiling the ISCAS-85 Benchmarks: A Case Study in Reverse Engineering , 1999, IEEE Des. Test Comput..

[5]  John P. Hayes,et al.  An approximate timing analysis method for datapath circuits , 1996, ICCAD 1996.

[6]  Mark Hirsch,et al.  Automatically extracting structure from a logical design , 1988, [1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers.

[7]  Giovanni De Micheli,et al.  Synthesis and Optimization of Digital Circuits , 1994 .

[8]  C. A. J. van Eijk,et al.  Regular layout generation of logically optimized datapaths , 1997, ISPD '97.

[9]  Ronald L. Rivest,et al.  Introduction to Algorithms , 1990 .

[10]  Fadi J. Kurdahi,et al.  On clustering for maximal regularity extraction , 1993, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[11]  Kurt Keutzer DAGON: Technology Binding and Local Optimization by DAG Matching , 1987, DAC.

[12]  Frank Harary,et al.  Graph Theory , 2016 .

[13]  Gotaro Odawara,et al.  Partitioning and Placement Technique for CMOS Gate Arrays , 1987, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[14]  John P. Hayes,et al.  High-level test generation using physically-induced faults , 1995, Proceedings 13th IEEE VLSI Test Symposium.

[15]  Ravi Varadarajan,et al.  A signature based approach to regularity extraction , 1997, ICCAD 1997.

[16]  John P. Hayes,et al.  Technology mapping for field-programmable gate arrays using integer programming , 1995, Proceedings of IEEE International Conference on Computer Aided Design (ICCAD).