Spectroscopy and control of near-surface defects in conductive thin film ZnO
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Ajaya K. Sigdel | J. Berry | J. Brédas | P. Winget | S. Graham | P. Ndione | Hong Li | Hyungchul Kim | O. Monti | David A. Racke | A. Sigdel | L. L. Kelly | P. Schulz