Methods for the measurement of thermal conductivity and thermal diffusivity of very thin films and foils

Abstract New methods for measuring the thermal conductivity λ, thermal diffusivity a and emissivity e of very thin electrically conducting and insulating films and foils are described. Measurements are performed at bismuth films and cellulose acetate foils and results are represented. The methods permit measurements even for very small film thicknesses d down to a lower linit of λd ≈ 10−8 WK−1. In comparison with publications known to us, this is more than one order of magnitude less than the lower limit reached up to now. Therefore, the methods described enable investigations of heat transport even on extreme thin films.

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