Preliminary frequency-, time-, and digital-domain testing and electromagnetic simulations indicate that the striplines and microstrip lines of Honeywell's thin-film multilayer (TFML) technology are suitable for high-performance digital systems that require operation at frequencies greater than 1 GHz. The return loss was typically -20 dB, which indicates the ability to design and fabricate controlled impedance lines with Honeywell's TFML technology. The 1- and 2-GHz digital-domain test measurements did not appear to be affected significantly by the reflections. The insertion loss of approximately -2.5 dB/in. at 9 GHz is acceptable for relatively short signal interconnect lines which, in any event, are required to minimize interchip propagation delays in a functioning system. Predictions from the Mayo electromagnetic modeling package show excellent agreement with measured signal and crosstalk waveforms. The crosstalk between adjacent lines is less than -20 dB even when the coupled line length is very long (>6 in.). Vias and via pads show negligible effects on insertion and return losses up to a frequency of 9 GHz. Large impedance mismatches severely affect the return losses, and therefore should be avoided. Stubs in the interconnect must be kept smaller than 1/4 of the smallest wavelength within the signal bandwidth.<<ETX>>
[1]
N. Teneketges,et al.
Multichip Packaging Design for VLSI-Based Systems
,
1987
.
[2]
Hiroshi Murano,et al.
Packaging technology for the NEC SX-3 supercomputers
,
1985
.
[3]
Daniel J. Schwab,et al.
Performance characteristics of thin film multilayer interconnects in the 1-10 GHz frequency range
,
1989,
Proceedings., 39th Electronic Components Conference.
[4]
B. K. Gilbert,et al.
The application of gallium arsenide integrated circuit technology to the design and fabrication of future generation digital signal processors: promises and problems
,
1988,
Proc. IEEE.
[5]
R. Jensen.
Recent Advances in Thin Film Multilayer Interconnect Technology for IC Packaging
,
1987
.
[6]
B. K. Gilbert,et al.
Transient Analysis of Single and Coupled Lines with Capacitively-Loaded Junctions (Comments)
,
1987
.
[7]
R. Jensen,et al.
Copper/polyimide Materials System for High Performance Packaging
,
1984
.