论文信息 - Stoichiometry Calculation in BaxSr1−xTiO3 Solid Solution Thin Films, Prepared by RF Cosputtering, Using X-Ray Diffraction Peak Positions and Boltzmann Sigmoidal Modelling - 字舞流文

Stoichiometry Calculation in BaxSr1−xTiO3 Solid Solution Thin Films, Prepared by RF Cosputtering, Using X-Ray Diffraction Peak Positions and Boltzmann Sigmoidal Modelling

F. Caballero-Briones | F. Chalé-Lara | A. Márquez-Herrera | M. Zapata-Torres | M. A. Corona-Rivera | J. L. Fernández-Muñoz | J. Reséndiz-Muñoz | M. Meléndez-Lira | O. Zelaya-Angel