Identification of the VAl-ON defect complex in AlN single crystals

J.-M. Maki,1,* I. Makkonen,1 F. Tuomisto,2 A. Karjalainen,3 S. Suihkonen,3 J. Raisanen,4 T. Yu. Chemekova,5 and Yu. N. Makarov6 1Helsinki Institute of Physics and Department of Applied Physics, Aalto University, P.O. Box 14100, FI-00076 Aalto, Espoo, Finland 2Department of Applied Physics, Aalto University, P.O. Box 11100, FI-00076 Aalto, Finland 3Department of Microand Nanosciences, Aalto University, P.O. Box 13000, FI-00076 Aalto, Espoo 4Accelerator Laboratory, University of Helsinki, P.O. Box 43, FI-00014, Helsinki, Finland 5GaN-Crystals, Ltd, St. Petersburg, Engels Avenue 27, 194156, Russia 6N-Crystals Group, St. Petersburg, Engels Avenue 27, 194156, Russia (Received 27 June 2011; published 29 August 2011)