An simple approach to evaluate TID response in High Voltage MOSFET for 65nm flash technology
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Yan Wang | Lei Jin | Dandan Jiang | Zongliang Huo | Ming Liu | Xiaonan Yang | Xinkai Li | Zhihong Yao | ZhaoAn Yu | Ming Liu | Yan Wang | Z. Huo | Zhaoan Yu | Dandan Jiang | Xinkai Li | Lei Jin | Xiaonan Yang | Zhihong Yao
[1] S. Gerardin,et al. Radiation Effects in Flash Memories , 2013, IEEE Transactions on Nuclear Science.
[2] H.S. Kim,et al. SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile Memory , 2006, IEEE Transactions on Nuclear Science.
[3] Shichang Zou,et al. Simple Method for Extracting Effective Sheet Charge Density Along STI Sidewalls Due to Radiation , 2011, IEEE Transactions on Nuclear Science.
[4] E. Paul. Nuclear Science , 1957, Nature.