A Sensor to Detect Normal or Reverse Temperature Dependence in Nanoscale CMOS Circuits

The temperature dependence of MOSFET drain current varies with supply voltage. Two distinct voltage regions exist—a normal dependence (ND) region where an increase in temperature decreases drain current, and a reverse dependence (RD) region where an increase in temperature increases drain current. Knowledge of the temperature dependence is critical for avoiding overheating and wasted performance from excessive guardbands. In this paper, we present the first temperature dependence sensor to detect whether a system is operating in the ND or RD region. The dependence sensor occupies an area of 985 NAND2 equivalent gates. The sensor consumes 15.9 pJ per sample at a supply voltage of 1 V, with a 1°C resolution over the military-specified temperature range of -55°C to 125°C.

[1]  Arijit Raychowdhury,et al.  A 1.05V 1.6mW 0.45°C 3σ-resolution ΔΣ-based temperature sensor with parasitic-resistance compensation in 32nm CMOS , 2009, 2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers.

[2]  Kofi A. A. Makinwa,et al.  A CMOS smart temperature sensor with a 3σ inaccuracy of ±0.1°C from -55°C to 125°C , 2005, IEEE J. Solid State Circuits.

[3]  Saurabh Dighe,et al.  Adaptive Frequency and Biasing Techniques for Tolerance to Dynamic Temperature-Voltage Variations and Aging , 2007, 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers.

[4]  I. Filanovsky,et al.  Mutual compensation of mobility and threshold voltage temperature effects with applications in CMOS circuits , 2001 .

[5]  Chris Toumazou,et al.  Trade-Offs in Analog Circuit Design , 2002 .

[6]  Kiyoo Itoh,et al.  Supply voltage scaling for temperature insensitive CMOS circuit operation , 1998 .

[7]  Eric MacDonald,et al.  Robust Ultra-Low Power Subthreshold Logic Flip-Flop Design for Reconfigurable Architectures , 2006, 2006 IEEE International Conference on Reconfigurable Computing and FPGA's (ReConFig 2006).

[8]  B. Streetman.  Solid state electronic devices , 1972 .

[9]  Paul Ampadu,et al.  Adaptive Delay Correction for Runtime Variation in Dynamic voltage Scaling Systems , 2008, J. Circuits Syst. Comput..

[10]  Hiroshi Iwai,et al.  On the scaling issues and high-κ replacement of ultrathin gate dielectrics for nanoscale MOS transistors , 2006 .

[11]  Yu Cao,et al.  Predictive Technology Model for Nano-CMOS Design Exploration , 2006, 2006 1st International Conference on Nano-Networks and Workshops.

[12]  G. Ji,et al.  Design and validation of a power supply noise reduction technique , 2003, Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710).

[13]  Paul Ampadu,et al.  Normal and Reverse Temperature Dependence in Variation-Tolerant Nanoscale Systems with High-k Dielectrics and Metal Gates , 2008, NanoNet.

[14]  Changhae Park,et al.  Reversal of temperature dependence of integrated circuits operating at very low voltages , 1995, Proceedings of International Electron Devices Meeting.

[15]  Volkan Kursun,et al.  Reversed Temperature-Dependent Propagation Delay Characteristics in Nanometer CMOS Circuits , 2006, IEEE Transactions on Circuits and Systems II: Express Briefs.

[16]  Balaram Sinharoy,et al.  Design and implementation of the POWER5 microprocessor , 2004, Proceedings. 41st Design Automation Conference, 2004..

[17]  Herming Chiueh,et al.  A high–speed CMOS on–chip temperature sensor , 1999 .

[18]  Trevor Mudge,et al.  Combined dynamic voltage scaling and adaptive body biasing for lower power microprocessors under dynamic workloads , 2002, ICCAD 2002.

[19]  E. Nowak,et al.  High-performance CMOS variability in the 65-nm regime and beyond. IBM J Res And Dev , 2006 .

[20]  Katherine Shu-Min Li,et al.  Temperature-aware dynamic frequency and voltage scaling for reliability and yield enhancement , 2009, 2009 Asia and South Pacific Design Automation Conference.

[21]  Poki Chen,et al.  A Fully Digital Time-Domain Smart Temperature Sensor Realized With 140 FPGA Logic Elements , 2007, IEEE Transactions on Circuits and Systems I: Regular Papers.

[22]  Manoj Sachdev,et al.  Variation-Aware Adaptive Voltage Scaling System , 2007, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.