A set of Virtual Instruments to simulate radiation effects in CMOS circuits

Over the years, it has become necessary to design chips tolerant to radiation effects - circuits that will be used not only by avionics and space industries, but also for chips to be operated at ground level. Single-Event Transients, Single-Event Upsets, Total Ionization Doses are some of the effects due to radiation and heavy ions which affects the electronic systems. It is important to develop new instruments to analyze the radiation effects in CMOS circuits. We developed a set of Virtual Instruments (VI) to be used with LabVIEW. These VIs are use to simulate, measure and observe several radiation-related effects in CMOS circuits.

[1]  G. C. Messenger,et al.  Collection of Charge on Junction Nodes from Ion Tracks , 1982, IEEE Transactions on Nuclear Science.

[2]  Robert Ecoffet,et al.  In-flight Anomalies on Electronic Devices , 2007 .

[3]  Ricardo Reis,et al.  Radiation Effects on Embedded Systems , 2010 .

[4]  R. Velazco,et al.  Single-event-upset-like fault injection: a comprehensive framework , 2005, IEEE Transactions on Nuclear Science.

[5]  F. Wrobel,et al.  Radioactive Nuclei Induced Soft Errors at Ground Level , 2009, IEEE Transactions on Nuclear Science.

[6]  Gary W. Johnson,et al.  LabVIEW Graphical Programming , 1994 .

[7]  B.L. Bhuva,et al.  Random Dopant Effect on Vt Variations Affecting the Soft-Error Rates of Nanoscale CMOS Memory Cells , 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

[8]  D. Munteanu,et al.  Modeling and Simulation of Single-Event Effects in Digital Devices and ICs , 2008, IEEE Transactions on Nuclear Science.

[9]  Ricardo Reis,et al.  SET and SEU simulation toolkit for LabVIEW , 2011, 2011 12th European Conference on Radiation and Its Effects on Components and Systems.

[10]  Ricardo P. Jasinski,et al.  Fault-Tolerance Techniques for SRAM-Based FPGAs , 2007, Comput. J..