Use of artificial intelligence techniques to fault diagnosis in analog systems

Basic concepts of fault diagnosis in analog and mixed (analog and digital) electronic systems by means of the simulation-before-test approach, the so called dictionary approach, have been presented. Special attention has been paid to application of artificial intelligence tools, such as: artificial neural networks, fuzzy sets and evolutionary computing.

[1]  Dong Liu,et al.  Entropy-based optimum test points selection for analog fault dictionary techniques , 2004, IEEE Transactions on Instrumentation and Measurement.

[2]  Keith Baker,et al.  Mixed signal test-techniques, applications and demands , 1996 .

[3]  Shambhu Upadhyaya,et al.  Linear circuit fault diagnosis using neuromorphic analyzers , 1997 .

[4]  Sandro Ridella,et al.  An example of back propagation: diagnosis of dyspepsia , 1989 .

[5]  F. Aminian,et al.  Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor , 2000 .

[6]  Jerzy Rutkowski,et al.  Finding of optimal excitation signal for testing of analog electronic circuits , 2007 .

[7]  Jacob A. Abraham,et al.  Analog Testing with Time Response Parameters , 1996, IEEE Des. Test Comput..

[8]  V. C. Prasad,et al.  Selection of test nodes for analog fault diagnosis in dictionary approach , 2000, IEEE Trans. Instrum. Meas..

[9]  Mark Zwolinski,et al.  Applying a robust heteroscedastic probabilistic neural network toanalog fault detection and classification , 2000, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[10]  Michal Strzelecki,et al.  Parametric testing of mixed-signal circuits by ANN processing of transient responses , 1996, J. Electron. Test..

[11]  Jerzy Rutkowski,et al.  Use of Genetic Algorithm to Optimum Test Frequency Selection , 2006 .

[12]  Farzan Aminian,et al.  Analog fault diagnosis of actual circuits using neural networks , 2002, IEEE Trans. Instrum. Meas..

[13]  A. Wu,et al.  Fast diagnosis of integrated circuit faults using feedforward neural networks , 1991, IJCNN-91-Seattle International Joint Conference on Neural Networks.

[14]  B. W. Jervis,et al.  Diagnosis of multifaults in analogue circuits using multilayer perceptrons , 1997 .

[15]  Kurosh Madani.  A survey of artificial neural networks based fault detection and fault diagnosis techniques , 1999, IJCNN'99. International Joint Conference on Neural Networks. Proceedings (Cat. No.99CH36339).

[16]  Jerzy Rutkowski,et al.  Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection , 2007, IEEE Transactions on Circuits and Systems II: Express Briefs.

[17]  Gordon W. Roberts,et al.  An Introduction to Mixed-Signal IC Test and Measurement , 2000 .

[18]  J.W. Bandler,et al.  Fault diagnosis of analog circuits , 1985, Proceedings of the IEEE.

[19]  Jerzy Rutkowski.  A two stage neural network DC fault dictionary , 1994, Proceedings of IEEE International Symposium on Circuits and Systems - ISCAS '94.

[20]  M. Mišík,et al.  Oxford University Press , 1968, PMLA/Publications of the Modern Language Association of America.

[21]  Linda S. Milor,et al.  Detection of catastrophic faults in analog integrated circuits , 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[22]  Marcantonio Catelani,et al.  On the application of neural networks to fault diagnosis of electronic analog circuits , 1996 .

[23]  Ada Fort,et al.  Soft fault detection and isolation in analog circuits: some results and a comparison between a fuzzy approach and radial basis function networks , 2002, IEEE Trans. Instrum. Meas..

[24]  I. M. Bell,et al.  Application of Kohonen and supervised forced organisation maps to fault diagnosis in CMOS opamps , 1994 .

[25]  W. Hochwald,et al.  A dc approach for analog fault dictionary determination , 1979 .

[26]  Jerzy Rutkowski,et al.  The Influence of Global Parametric Faults on Analogue Electronic Circuits Time Domain Response Features , 2008, 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems.

[27]  S. Bedrosian,et al.  Fault isolation algorithm for analog electronic systems using the fuzzy concept , 1979 .

[28]  Lotfi A. Zadeh,et al.  Fuzzy Sets , 1996, Inf. Control..

[29]  Andrew Richardson,et al.  Design for testability strategies for mixed signal & analogue designs-from layout to system , 1998, 1998 IEEE International Conference on Electronics, Circuits and Systems. Surfing the Waves of Science and Technology (Cat. No.98EX196).

[30]  R. Zielonko,et al.  Fault diagnosis in electronic circuits based on bilinear transformation in 3D and 4D space , 2001, IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188).

[31]  Antony Wakeling,et al.  Fault diagnosis in analogue circuits using AI techniques , 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

[32]  Zbigniew Czaja,et al.  Fault diagnosis in electronic circuits based on bilinear transformation in 3-D and 4-D spaces , 2003, IEEE Trans. Instrum. Meas..

[33]  Ada Fort,et al.  SBT soft fault diagnosis in analog electronic circuits: a sensitivity-based approach by randomized algorithms , 2002, IEEE Trans. Instrum. Meas..

[34]  Jerzy Rutkowski,et al.  Optimum Tests Selection for Analog Circuits with the Use of Genetic Algorithm , 2005 .

[35]  Alberto L. Sangiovanni-Vincentelli,et al.  Minimizing production test time to detect faults in analog circuits , 1994, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[36]  L. S. Milor,et al.  A tutorial introduction to research on analog and mixed-signal circuit testing , 1998 .

[37]  小沢 孝夫.  Analog methods for computer-aided circuit analysis and diagnosis , 1988 .

[38]  R. Zielonko.  Some theoretical foundations of analog signal shape design for measurement and testing , 1996 .

[39]  Venkat Venkatasubramanian,et al.  A neural network methodology for process fault diagnosis , 1989 .