Examination of lifetime-limiting failure mechanisms in CIGSS-based PV minimodules under environmental stress

In our study, Shell Solar Industries (SSI) minimodules were subjected to dry heat (85°C), damp heat (85°C/100% RH), and anaerobic/aerobic 85°C water baths. After 168 hrs exposure to moisture-containing environments, the SSI power generation decreased by over 50% of that of the original state. Analytical characterization performed before and after the exposure identified degradation of the Al:ZnO and Mo layers as likely device failure routes. To elucidate the observed degradation mechanism, individual Al:ZnO and Mo films were sputtered onto borosilicate glass and exposed to both 85°C/100% RH and a room temperature water bath. After 24 hrs the resistivity and optical transmission of the Al:ZnO films increased significantly following both exposure methods. XPS surface analysis of the films revealed changes in the O to Zn bonding ratio suggesting film hydration may have occurred. In addition, after 48 hours by both exposure methods the Mo films corroded, and the film resistivities increased. Our results show Al:ZnO layer degradation limits the lifetime of CIGSS based PV devices, whereas Mo degradation is considered a non-lifetime-limiting failure.