Power-down processing reliability test device and method for intelligent ammeters in interference environment

The invention discloses an automatic power-down processing reliability test device and method for intelligent ammeters in an interference environment. The automatic power-down processing reliability test device comprises an automatic test controller, an inductive load switching device and at least two ammeters to be tested, wherein the automatic test controller is computer equipment which automatic testing software is installed in and is provided with a communication interface. The automatic power-down processing reliability test method comprises the following steps: an input power supply inside a switching device is switched off by controlling the inductive load switching device, a power supply of a paralleling reactor inside the switching device is switched off while the ammeters to be tested which are connected to a switching device voltage loop in parallel are powered down, an inductive load switching interference is generated in a simulated mode, and the inductive load switching interference is output to the voltage loop of the ammeters to be tested through a voltage interface; communication with the ammeters to be tested is conducted through an RS485 interface, operating data of the ammeters to be tested before being powered down and operating data of the ammeters to be tested after being powered up again for operation are detected, so that whether power-down processing of the intelligent ammeters to be tested under the inductive load switching interference is normal is judged, an assessment of the power-down processing reliability of the intelligent ammeters under the interference is realized, and faults are prevented from happening.